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Full set of the calibration standards for SPM lateral and vertical calibration (including submicron calibration in X or Y direction), test grating for determination of the tip shape, SNOM test grating.
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Full set of calibration standards for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape. |
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Calibration grating for SPM and STM submicron calibration in X or Y direction (278nm). |
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Special test grating for Scanning Near Field Optical Microscope (SNOM). |
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